ESREF 2020—Best Paper Award

The Best Paper Award Committee (BPA) of the 31st European Symposium on Reliability of Electron Devices, Failure Physics, and Analysis, ESREF 2020, have chosen CSEM’s Maxime Auchlin’s and co-authors’ paper entitled “Can automotive MEMS be reliably used in space applications? An assessment method under sequential bi-parameter testing” to be presented at the International Symposium for Testing and Failure Analysis (ISTFA) 2021, in the USA.